Title :
Numerical Analysis of a Pulsed Compact LTD System for Electron Beam-Driven Radiography
Author :
Rose, David V. ; Welch, Dale R. ; Oliver, Bryan V. ; Leckbee, Joshua J. ; Maenchen, John E. ; Johnson, David L. ; Kim, Alexandre A. ; Kovalchuk, Boris M. ; Sinebryukhov, Vadim A.
Author_Institution :
Voss Scientific LLC, Albuquerque, NM
Abstract :
This paper describes the configuration and operation of a seven-cavity linear transformer driver (LTD) system. This LTD system is configured to deliver ~1 MV and 125 kA into a critically damped load. A detailed transmission line model coupled to particle-in-cell simulations is used to assess the system electrical performance. The evolution of the electron power flow in negative polarity is simulated, and the impact of this flow on the operation of the system with a large-area hollow electron beam diode is examined. The simulation results are compared with available electrical measurements and with dose rate measurements where a flash X-ray pulse is produced by an annular electron beam diode. These comparisons suggest that the LTD system meets the design specifications and is a robust pulsed power architecture. Additionally, the positive polarity operation for the LTD system driving a rod-pinch diode load is modeled to further assess the utility of the LTD system
Keywords :
electron beams; power transformers; pulse transformers; pulsed power supplies; radiography; transmission line theory; 125 kA; dose rate measurements; electrical measurements; electron beam-driven radiography; electron power flow; flash X-ray pulse; hollow electron beam diode; linear transformer driver; negative polarity; particle-in-cell simulations; pulsed power architecture; rod-pinch diode load; transmission line model; Couplings; Diodes; Electric variables measurement; Electron beams; Numerical analysis; Power system modeling; Power transmission lines; Pulse measurements; Pulse transformers; Radiography; Linear transformer driver; X-ray source; magnetically insulated transmission line; particle-in-cell simulation;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2006.881297
