DocumentCode :
790257
Title :
A 0.5-8.5 GHz fully differential CMOS distributed amplifier
Author :
Ahn, Hee-Tae ; Allstot, David J.
Author_Institution :
QUALCOMM Inc., San Diego, CA, USA
Volume :
37
Issue :
8
fYear :
2002
fDate :
8/1/2002 12:00:00 AM
Firstpage :
985
Lastpage :
993
Abstract :
A fully integrated fully differential distributed amplifier with 5.5 dB pass-band gain and 8.5 GHz unity-gain bandwidth is described. The fully differential CMOS circuit topology yields wider bandwidth than its single-ended counterpart, by eliminating the source degeneration effects of parasitic interconnect, bond wire, and package inductors. A simulated annealing CAD tool underpins the parasitic-aware methodology used to optimize the design including all on-chip active and passive device and off-chip package parasitics. Mixed-mode S-parameter measurement techniques used for fully differential circuit testing are reviewed. Integrated in 1.3×2.2 mm2 in a standard 0.6 μm CMOS process, the distributed amplifier dissipates 216 mW from a single 3 V supply.
Keywords :
CMOS analogue integrated circuits; S-parameters; circuit CAD; circuit optimisation; distributed amplifiers; integrated circuit design; radiofrequency amplifiers; simulated annealing; wideband amplifiers; 0.5 to 8.5 GHz; 0.6 micron; 216 mW; 3 V; 5.5 dB; 8.5 GHz; CAD tool; bond wire; design optimization; fully-integrated fully-differential CMOS distributed amplifier; mixed-mode S-parameter measurement; package inductor; parasitic interconnect; parasitic-aware methodology; pass-band gain; simulated annealing; source degeneration; unity-gain bandwidth; Bandwidth; Bonding; Circuit topology; Distributed amplifiers; Gain; Inductors; Integrated circuit interconnections; Integrated circuit yield; Packaging; Wire;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2002.800960
Filename :
1020237
Link To Document :
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