DocumentCode :
790278
Title :
Frequency dependence on bias current in 5 GHz CMOS VCOs: impact on tuning range and flicker noise upconversion
Author :
Levantino, Salvatore ; Samori, Carlo ; Bonfanti, Andrea ; Gierkink, Sander L J ; Lacaita, Andrea L. ; Boccuzzi, Vito
Author_Institution :
Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
Volume :
37
Issue :
8
fYear :
2002
fDate :
8/1/2002 12:00:00 AM
Firstpage :
1003
Lastpage :
1011
Abstract :
The tuning curve of an LC-tuned voltage-controlled oscillator (VCO) substantially deviates from the ideal curve 1/√(LC(V)) when a varactor with an abrupt C(V) characteristic is adopted and the full oscillator swing is applied directly across the varactor. The tuning curve becomes strongly dependent on the oscillator bias current. As a result, the practical tuning range is reduced and the upconverted flicker noise of the bias current dominates the 1/f3 close-in phase noise, even if the waveform symmetry has been assured. A first-order estimation of the tuning curve for MOS-varactor-tuned VCOs is provided. Based on this result, a simplified phase-noise model for double cross-coupled VCOs is derived. This model can be easily adapted to cover other LC-tuned oscillator topologies. The theoretical analyses are experimentally validated with a 0.25 μm CMOS fully integrated VCO for 5 GHz wireless LAN receivers. By eliminating the bias current generator in a second oscillator, the close-in phase noise improves by 10 dB and features -70 dBc/Hz at 10 kHz offset. The 1/f2 noise is -132 dBc/Hz at 3 MHz offset. The tuning range spans from 4.6 to 5.7 GHz (21%) and the current consumption is 2.9 mA.
Keywords :
1/f noise; CMOS analogue integrated circuits; circuit tuning; flicker noise; integrated circuit noise; phase noise; voltage-controlled oscillators; 0.25 micron; 1/f2 noise; 1/f3 close-in phase noise; 2.9 mA; 4.6 to 5.7 GHz; 5 GHz; CMOS VCO; LC tuning; MOS varactor tuning; bias current; flicker noise upconversion; frequency dependence; tuning range; waveform symmetry; wireless LAN receiver; 1f noise; CMOS technology; Circuit optimization; Frequency dependence; Phase locked loops; Phase noise; Semiconductor device modeling; Tuning; Varactors; Voltage-controlled oscillators;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2002.800969
Filename :
1020239
Link To Document :
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