DocumentCode :
790287
Title :
Statistical distribution of the internal field in planar ferrites
Author :
Pardavi-Horvath, Martha ; Yan, Jijin
Author_Institution :
Dept. of Electr. & Comput. Eng., George Washington Univ., DC, USA
Volume :
39
Issue :
5
fYear :
2003
Firstpage :
3154
Lastpage :
3156
Abstract :
The effects of nonellipsoidal geometry and the role of corners and edges of planar ferrite elements in current microwave and millimeter wave devices are investigated numerically using micromagnetic methods. The noncollinear static magnetization ground state is calculated for the case of three-dimensional rectangular Y3Fe5O12 (YIG). The statistical distribution of the internal field over the YIG volume was obtained for different aspect ratios. The distribution of the internal field is bimodal. The low-field mode is concentrated in the volume, the high-field mode is produced by the surface of the ferrite. The nonuniform magnetization persists well in fields above 1.5 times the 4πMs magnetization, requiring higher bias fields for proper operation of planar ferrite devices.
Keywords :
garnets; ground states; magnetic thin film devices; magnetic thin films; magnetisation; micromagnetics; microwave devices; millimetre wave devices; yttrium compounds; YFe5O12; YIG; bimodal; corners; current microwave devices; edges; high-field mode; internal field; low-field mode; micromagnetic methods; millimeter wave devices; noncollinear static magnetization ground state; nonellipsoidal geometry; planar ferrite devices; planar ferrites; statistical distribution; three-dimensional rectangular YIG; Ferrites; Geometry; Magnetization; Micromagnetics; Microwave devices; Microwave theory and techniques; Millimeter wave devices; Millimeter wave technology; Stationary state; Statistical distributions;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2003.816041
Filename :
1233329
Link To Document :
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