Title :
Faraday rotation in quaternary CdMnCoTe thick films deposited on transparent quartz glass substrates
Author :
Okada, Akira ; Ahn, Jin-Yong ; Inoue, Satoru ; Yamaguchi, Toshinao ; Imamura, Masaaki
Author_Institution :
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Amagasaki, Japan
Abstract :
Faraday rotation θF at an optical wavelength of 635 nm is studied on quaternary CdMnCoTe thick films deposited on quartz glass substrates by molecular beam epitaxy. The magnitude of θF in the CdMnCoTe film is compared with that in CdMnTe film. It is shown that the Faraday rotation for Cd0.43Mn0.54Co0.03Te film is approximately four times that for Cd0.40Mn0.60Te film. The value of θF in the Cd0.43Mn0.54Co0.03Te film at 635 nm was -1.2° under a magnetic field of 5.8 kOe. The observed signal due to Faraday effect is shown for a 0.1-Hz alternating magnetic field with an amplitude of 5.8 kOe.
Keywords :
Faraday effect; II-VI semiconductors; cadmium compounds; cobalt compounds; magnetic epitaxial layers; manganese compounds; molecular beam epitaxial growth; semiconductor epitaxial layers; semiconductor growth; semimagnetic semiconductors; 635 nm; Cd0.43Mn0.54Co0.03Te; Faraday rotation; SiO2; molecular beam epitaxy; optical wavelength; quaternary CdMnCoTe thick films; transparent quartz glass substrates; Faraday effect; Ferrimagnetic films; Glass; Magnetic films; Molecular beam epitaxial growth; Optical films; Semiconductor films; Substrates; Tellurium; Thick films;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2003.816048
