Title :
Effect of grain size on domain structure of thin nonoriented Si-Fe electrical sheets
Author :
Takezawa, M. ; Wada, Y. ; Yamasaki, J. ; Honda, T. ; Kaido, C.
Author_Institution :
Dept. of Appl. Sci. for Integrated Syst. Eng., Kyushu Inst. of Technol., Kitakyushu, Japan
Abstract :
Domain configuration of the nonoriented Si-Fe electrical sheets with different grain size was observed decreasing their sheet thickness by using the Kerr effect. It was found that the nonoriented sheet needs multiple grains in the sheet thickness direction to eliminate the normal magnetization component in the flux closing structure causing excessive eddy current loss.
Keywords :
eddy current losses; ferromagnetic materials; grain size; iron alloys; magnetic domains; magnetic flux; magnetisation; silicon alloys; Kerr effect; Si-Fe; anomaly factor; domain structure; eddy current loss; flux closing structure; grain size; hysteresis loss; normal magnetization component elimination; sheet thickness; thin nonoriented Si-Fe electrical sheets; Costs; Eddy currents; Grain size; Iron; Kerr effect; Magnetic domains; Magnetic force microscopy; Magnetization; Resistance heating; Steel;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2003.816149
