DocumentCode :
790613
Title :
Reliability figures of merit for surface-soldered leadless chip carriers compared to lead packages
Author :
Clech, Jean-Paul M. ; Engelmaier, Werner ; Kotlowitz, Robert W. ; Augis, Jacques A.
Author_Institution :
AT&T Bell Lab., Whippany, NJ, USA
Volume :
12
Issue :
4
fYear :
1989
fDate :
12/1/1989 12:00:00 AM
Firstpage :
449
Lastpage :
458
Abstract :
Solder attachment reliability figures of merit (FMs) have been developed that account for the primary factors determining long-term interconnection integrity. The FMs provide relative measures of the reliability impact of a component or device/substrate assembly and serve as a GO/NO-GO decision tool for package, physical, and circuit designers. The FMs are an integral part of the design-for-reliability process at key product development stages. These design phases include component design and/or selection, component/substrate assembly design, and system design, including thermal environment, product service life, and attachment reliability target. The use of FMs for attachment reliability evaluation is discussed through examples based on the solder-joint fatigue performance of thermally cycled leaded and leadless surface-mounted devices
Keywords :
environmental testing; fatigue testing; integrated circuit technology; life testing; packaging; printed circuit manufacture; reliability; soldering; surface mount technology; GO/NO-GO decision tool; attachment reliability evaluation; attachment reliability target; circuit design; design phases; design-for-reliability process; device/substrate assembly; lead packages; leadless surface-mounted devices; long-term interconnection integrity; package design; physical design; primary factors; product development stages; product service life; reliability impact; solder attachment reliability figures of merit; solder-joint fatigue performance; surface-soldered leadless chip carriers; thermal cycling; thermal environment; Capacitive sensors; Fatigue; Lead; Magneto electrical resistivity imaging technique; Packaging; Samarium; Soldering; Temperature distribution; Thermal expansion; Thermal stresses;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.49001
Filename :
49001
Link To Document :
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