Title :
Temperature Dependence of Operating Margins for a 16-Mbit Bubble Memory Chip
Author :
Ohashi, M. ; Amatsu, M. ; Nakagawa, Y. ; Inoue, H.
Author_Institution :
Fujitsu Lab. Ltd.
fDate :
7/1/1988 12:00:00 AM
Keywords :
Data engineering; Detectors; Garnet films; Magnetic properties; Magnetics Society; Memory; Temperature dependence; Temperature distribution; Testing; Transistors;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1988.4563769
