Title :
On the scaling of inclusions size in metal-dielectric windows at normal incidence
Author :
Frenkel, Avraham
Author_Institution :
Anafa Electromagn. Solutions Ltd., Kiriat Bialik, Israel
fDate :
6/24/1905 12:00:00 AM
Abstract :
A three-quarters wavelength thick metal-dielectric electromagnetic (EM) window is investigated. The window is centrally loaded by a periodic array of sub-resonant conducting inclusions, and has a wider frequency bandwidth than the standard half-wavelength thick window. Using spherical inclusions, we show that for every grid-constant of the periodic array there is a radius of the inclusions that minimizes the reflection from the window. We discuss the scaling law that governs these optimized structures.
Keywords :
conducting bodies; electromagnetic wave reflection; electromagnetic wave transmission; inhomogeneous media; microwave propagation; millimetre wave propagation; radomes; 10 to 60 GHz; EM window; electromagnetic window; inclusions; metal-dielectric windows; periodic array; radome; scaling law; spherical inclusions; subresonant conducting inclusions; Bandwidth; Conducting materials; Dielectric constant; Dielectric devices; Electromagnetic scattering; Frequency; Nonhomogeneous media; Propagation losses; Reflection; Slabs;
Journal_Title :
Antennas and Wireless Propagation Letters, IEEE
DOI :
10.1109/LAWP.2002.802580