Title :
Estimating Parametric Line-Source Models With Electroencephalography
Author :
Nannan Cao ; Yetik, I.S. ; Nehorai, A. ; Muravchik, C.H. ; Haueisen, J.
Author_Institution :
Dept. of Electr. & Syst. Eng., Washington Univ., St. Louis, MO
Abstract :
We develop three parametric models for electroencephalography (EEG) to estimate current sources that are spatially distributed on a line. We assume a realistic head model and solve the EEG forward problem using the boundary element method (BEM). We present the models with increasing degrees of freedom, provide the forward solutions, and derive the maximum-likelihood estimates as well as Crameacuter-Rao bounds of the unknown source parameters. A series of experiments are conducted to evaluate the applicability of the proposed models. We use numerical examples to demonstrate the usefulness of our line-source models in estimating extended sources. We also apply our models to the real EEG data of N20 response that is known to have an extended source. We observe that the line-source models explain the N20 measurements better than the dipole model
Keywords :
boundary-elements methods; brain models; electroencephalography; maximum likelihood estimation; BEM; Cramer-Rao bounds; EEG forward problem; N20 response; boundary element method; current source estimation; dipole model; electroencephalography; line-source models; maximum-likelihood estimates; parametric line-source models; realistic head model; Biomedical engineering; Biomedical measurements; Boundary element methods; Brain modeling; Electroencephalography; Head; Inverse problems; Parametric statistics; Scalp; Systems engineering and theory; CramÉr-Rao bounds; EEG; extended source modeling; Action Potentials; Algorithms; Brain; Computer Simulation; Diagnosis, Computer-Assisted; Electroencephalography; Humans; Models, Neurological;
Journal_Title :
Biomedical Engineering, IEEE Transactions on
DOI :
10.1109/TBME.2006.880885