• DocumentCode
    79121
  • Title

    A 1.65 W fully integrated 90 nm bulk cmos capacitive DC-DC converter with intrinsic charge recycling

  • Author

    Meyvaert, H. ; Van Breussegem, Tom ; Steyaert, M.

  • Author_Institution
    Dept. of Electr. Eng., Katholieke Univ. Leuven, Heverlee, Belgium
  • Volume
    28
  • Issue
    9
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    4327
  • Lastpage
    4334
  • Abstract
    A fully integrated high power density capacitive 2:1 step-down DC-DC converter is designed in a standard CMOS technology. The converter implements the presented flying well technique and intrinsic charge recycling technique to deliver a maximum output power of 1.65 W on a chip area of 2.14 mm2, resulting in a power conversion density of 0.77 W/mm2 . A peak power conversion efficiency of 69% is achieved, leading to an efficiency enhancement factor of +36% with respect to a linear regulator. This is for a voltage step-down conversion from twice the nominal supply voltage of a 90 nm technology (2Vdd = 2.4 V) to 1 V.
  • Keywords
    CMOS integrated circuits; DC-DC power convertors; bulk CMOS capacitive DC-DC converter; efficiency enhancement factor; high power density capacitive; intrinsic charge recycling technique; linear regulator; nominal supply voltage; peak power conversion efficiency; power 1.65 W; size 90 nm; standard CMOS technology; voltage 1 V; voltage step down conversion; CMOS integrated circuits; Capacitors; Density measurement; Impedance; Recycling; Topology; Voltage control; Capacitive; DC–DC converter; fully integrated; intrinsic charge recycling (ICR); power converter; switched capacitor;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2012.2230339
  • Filename
    6363613