DocumentCode :
79127
Title :
The influence of piezoceramic stack location on nonlinear behavior of langevin transducers
Author :
Mathieson, Andrew ; Cardoni, A. ; Cerisola, N. ; Lucas, Margaret
Author_Institution :
Sch. of Eng., Univ. of Glasgow, Glasgow, UK
Volume :
60
Issue :
6
fYear :
2013
fDate :
Jun-13
Firstpage :
1126
Lastpage :
1133
Abstract :
Power ultrasonic applications such as cutting, welding, and sonochemistry often use Langevin transducers to generate power ultrasound. Traditionally, it has been proposed that the piezoceramic stack of a Langevin transducer should be located in the nodal plane of the longitudinal mode of vibration, ensuring that the piezoceramic elements are positioned under a uniform stress during transducer operation, maximizing element efficiency and minimizing piezoceramic aging. However, this general design rule is often partially broken during the design phase if features such as a support flange or multiple piezoceramic stacks are incorporated into the transducer architecture. Meanwhile, it has also been well documented in the literature that power ultrasonic devices driven at high excitation levels exhibit nonlinear behaviors similar to those observed in Duffing-type systems, such as resonant frequency shifts, the jump phenomenon, and hysteretic regions. This study investigates three Langevin transducers with different piezoceramic stack locations by characterizing their linear and nonlinear vibrational responses to understand how the stack location influences nonlinear behavior.
Keywords :
ageing; piezoceramics; piezoelectric transducers; ultrasonic transducers; vibrations; Duffing-type systems; design phase; design rule; element efficiency; hysteretic regions; jump phenomenon; langevin transducers; nodal plane; nonlinear behavior; nonlinear vibrational response; piezoceramic aging; piezoceramic stack location; power ultrasonic devices; power ultrasound; resonant frequency shifts; sonochemistry; vibration longitudinal mode;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2013.2675
Filename :
6521061
Link To Document :
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