DocumentCode :
791289
Title :
High-resolution MFM: Simulation of tip sharpening
Author :
Saito, Hitoshi ; Van den Bos, Arnout ; Abelmann, Leon ; Lodder, J.Cock
Author_Institution :
Akita Univ., Japan
Volume :
39
Issue :
5
fYear :
2003
Firstpage :
3447
Lastpage :
3449
Abstract :
The transfer functions of tips with various sharpened tip ends were calculated and the resolution of these tips was estimated by considering the resolution limit due to thermal noise at room temperature. The tip having an ellipsoidal tip end (ellipsoidal tip) is found to be a suitable candidate for high-resolution magnetic force microscopy. Sharpening of the flat tip end makes zero signal frequencies disappear for tips with ellipticities larger than tan45°. The sensitivity shows a maximum around an ellipticity of tan80°. The ellipsoidal tip shows a much smaller tip thickness dependence compared to the tip having a flat tip end because only the tip end mainly contributes to signals in case of the ellipsoidal tip.
Keywords :
magnetic force microscopy; thermal noise; transfer functions; 300 K; ellipticity; high-resolution MFM; thermal noise; tip sharpening; transfer functions; Frequency; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetization; Scanning electron microscopy; Shape; Signal design; Signal resolution; Transfer functions;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2003.816178
Filename :
1233424
Link To Document :
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