DocumentCode :
791358
Title :
Influence of spacer thickness reduction on bias level and peak asymmetry in SAL-biased MR heads
Author :
Mitsumata, Chiharu ; Kobayashi, Toshio ; Liao, Simon H.
Author_Institution :
Magnetic & Electron. Mater. Res. Lab., Hitachi Metals Ltd., Saitama, Japan
Volume :
31
Issue :
6
fYear :
1995
fDate :
11/1/1995 12:00:00 AM
Firstpage :
2630
Lastpage :
2632
Abstract :
The peak asymmetry relates to the bias level of a magnetoresistive sensor. However, the peak asymmetry is affected not only by bias level but also by the shape of the transfer curve. Measured MR bias level and peak asymmetry are less sensitive to bias current variation when the spacer thickness between MR and SAL is reduced. The numerical calculation shows that the magnetization distribution in the MR film becomes more uniform when a thinner spacer is used, indicating stronger magnetostatic coupling between layers. Calculated results of the peak asymmetry and the bias level versus bias current are in good agreement with the experimental data
Keywords :
magnetic heads; magnetic recording; magnetic thin film devices; magnetisation; magnetoresistive devices; MR film; SAL-biased MR heads; bias current variation; bias level; magnetization distribution; magnetoresistive sensor; magnetostatic coupling; numerical calculation; peak asymmetry; quasistatic testing; spacer thickness reduction; transfer curve shape; Coercive force; Current density; Demagnetization; Magnetic field measurement; Magnetic heads; Magnetization; Pulse measurements; Rough surfaces; Surface roughness; Testing;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.490075
Filename :
490075
Link To Document :
بازگشت