• DocumentCode
    791378
  • Title

    Micron and Submicron Particle Production

  • Author

    Hendricks, Charles D.

  • Author_Institution
    Charged Particle Research Laboratory, Department of Electrical Engineering, University of Illinois, Urbana, Ill. 61801.
  • Issue
    4
  • fYear
    1974
  • fDate
    7/1/1974 12:00:00 AM
  • Firstpage
    508
  • Lastpage
    510
  • Abstract
    In many fields of industrial interest, particle sampling and/or control is very important. However, the calibration and testing of sampling equipment have been difficult because of the lack of sources of uniform particles. In this paper a source of uniform solid or liquid particles is described together with the characteristics of the source and the particles produced. Fractional standard deviations of 10-3 in particle-size distribution are readily obtainable. The particles may be uncharged or charged to a predetermined level. Uses include the fields of aerosol sampling equipment testing, precipitator development and testing, as well as many others.
  • Keywords
    Aerosols; Air pollution; Calibration; Industrial control; Particle production; Sampling methods; Societies; Solids; Surface tension; Testing;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.1974.349187
  • Filename
    4157631