DocumentCode
791378
Title
Micron and Submicron Particle Production
Author
Hendricks, Charles D.
Author_Institution
Charged Particle Research Laboratory, Department of Electrical Engineering, University of Illinois, Urbana, Ill. 61801.
Issue
4
fYear
1974
fDate
7/1/1974 12:00:00 AM
Firstpage
508
Lastpage
510
Abstract
In many fields of industrial interest, particle sampling and/or control is very important. However, the calibration and testing of sampling equipment have been difficult because of the lack of sources of uniform particles. In this paper a source of uniform solid or liquid particles is described together with the characteristics of the source and the particles produced. Fractional standard deviations of 10-3 in particle-size distribution are readily obtainable. The particles may be uncharged or charged to a predetermined level. Uses include the fields of aerosol sampling equipment testing, precipitator development and testing, as well as many others.
Keywords
Aerosols; Air pollution; Calibration; Industrial control; Particle production; Sampling methods; Societies; Solids; Surface tension; Testing;
fLanguage
English
Journal_Title
Industry Applications, IEEE Transactions on
Publisher
ieee
ISSN
0093-9994
Type
jour
DOI
10.1109/TIA.1974.349187
Filename
4157631
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