Title :
Micromagnetic modeling of a single element MR head
Author :
Koehler, T.R. ; Williams, M.L.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fDate :
11/1/1995 12:00:00 AM
Abstract :
Micromagnetic modeling was used to study the behavior of a shielded, single element, exchange biased magnetoresistive head with dimensions appropriate for 10 Gb/in2 recording. Its read sensitivity appears to be superior to that of a comparable, conventional soft adjacent layer biased head and its noise characteristics are favorable
Keywords :
magnetic heads; magnetic recording noise; magnetisation; magnetoresistive devices; 10 Gb/in2 recording; MR response curve; exchange biased magnetoresistive head; magnetization patterns; micromagnetic modeling; noise characteristics; read sensitivity; shielded MR head; single element MR head; track profiles; Current density; Demagnetization; Geometry; Magnetic heads; Magnetization; Magnetoresistance; Micromagnetics; Solid modeling; Working environment noise;
Journal_Title :
Magnetics, IEEE Transactions on
