• DocumentCode
    79145
  • Title

    Advanced Low-Voltage Power MOSFET Technology for Power Supply in Package Applications

  • Author

    Boyi Yang ; Jun Wang ; Shuming Xu ; Korec, Jacek ; Shen, Z. John

  • Author_Institution
    Texas Instrum., Inc., Bethlehem, PA, USA
  • Volume
    28
  • Issue
    9
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    4202
  • Lastpage
    4215
  • Abstract
    In this paper, a high-current dc-dc power supply in package is reported with an emphasis on the design aspects of the low- and high-side power MOSFETs embedded in the power module. A new NexFET structure with its source electrode on the bottom side of the die (source down) is designed to enable an innovative stacked-die PSiP technology with significantly reduced parasitic inductance and package footprint. A gate voltage pulldown circuitry monolithically integrated in the low-side NexFET is introduced to effectively prevent shoot-through faults even when a very low gate threshold voltage is used to reduce conduction and body diode reverse-recovery-related power losses. In addition, an asymmetric gate resistor circuitry is monolithically integrated in the high-side NexFET to minimize voltage ringing at the switch node. With all these novel device technology improvements, the new power supply in package module delivers a significant improvement in efficiency and offers an excellent solution for future high-frequency, high-current-density dc-dc converters.
  • Keywords
    DC-DC power convertors; power MOSFET; power supply circuits; asymmetric gate resistor circuitry; body diode reverse recovery related power loss; gate voltage pulldown circuitry; high current dc-dc power supply; high current density dc-dc converters; high side NexFET structure; high side power MOSFET; innovative stacked die PSiP technology; low gate threshold voltage; low voltage power MOSFET technology; package application; package footprint; package module; power module; reduced parasitic inductance; shoot through faults; source electrode; Electrodes; Inductance; Logic gates; Low voltage; Power MOSFET; Power supplies; Asymmetric gate resistor; gate voltage pull-down circuit; integration; low-voltage power MOSFET; power loss; source-down structure power MOSFET; stacked-die package; synchronous buck converters;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2012.2230407
  • Filename
    6363615