Title :
Yoke flux reversal time in thin-film write heads
Author :
Klaassen, K.B. ; van Peppen, J.C.L.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fDate :
11/1/1995 12:00:00 AM
Abstract :
A simple method is described for measuring the time dependency of the magnetization reversal process in the yoke of thin-film inductive write heads. Measurement results are given for an experimental head, showing close agreement with earlier published, calculated data
Keywords :
magnetic heads; magnetic thin film devices; magnetisation reversal; magnetization reversal; thin-film inductive write heads; yoke flux reversal time; Conducting materials; Driver circuits; Eddy currents; Frequency; Hard disks; Magnetic heads; Magnetization reversal; Saturation magnetization; Time measurement; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
