Title :
Quality inspection of electroplated materials using planar type micro-magnetic sensors with post-processing from neural network model
Author :
Mukhopadhyay, S.C.
Author_Institution :
Inst. of Inf. Sci. & Technol., Massey Univ., Palmerston North, New Zealand
fDate :
7/1/2002 12:00:00 AM
Abstract :
The possibility of employing planar type micro-magnetic sensors for the evaluation of the quality of electroplated materials as well as to inspect the presence of defects in its near-surface is investigated. The impedance of a planar type micro-magnetic sensor in the proximity of any metal surface is a complex function of many parameters including near-surface material properties. A two-dimensional model of two types of planar micro-magnetic sensors having meander and mesh type configurations has been developed for the analytical calculation of magnetic vector potential, flux-linkage and impedance. The impedance of the sensor is used for the evaluation of the quality of the electroplated materials. Usually an off-line generated grid system is used for the online evaluation of near-surface material properties. Use of a simple neural network model is proposed for the post-processing of output parameters from the measured impedance data as an alternative to the grid system
Keywords :
coils; electroplating; magnetic sensors; microsensors; quality control; electroplated materials; flux-linkage; impedance; magnetic vector potential; meander configurations; mesh type configurations; near-surface material properties; neural network model; off-line generated grid system; output parameters; planar type micro-magnetic sensors; post-processing; proximity; quality inspection; two-dimensional model;
Journal_Title :
Science, Measurement and Technology, IEE Proceedings -
DOI :
10.1049/ip-smt:20020340