Title :
Self-assembling Ge(Si)/Si(100) quantum dots
Author_Institution :
Dept. of Phys. & Astron., Arizona State Univ., Tempe, AZ, USA
fDate :
8/1/2002 12:00:00 AM
Abstract :
The morphological evolution of self-assembled epitaxial quantum dots on Si(100) is reviewed. This intensely investigated material system continues to provide fundamental insight guiding the growth of nanostructured electronic materials. Self-assembled quantum dots are faceted, three-dimensional islands which grow atop a planar wetting layer. Pure Ge growth at higher substrate temperatures results in narrower island size distributions but activates additional strain-relief mechanisms which will alter the optical and electronic properties of the dots. Optical and electrical characterization has shown that electrons and holes are confined to different regions of the dot. This results in a spatially indirect, type II recombination mechanism. Emerging device applications which exploit properties of these nanoscale Ge islands are discussed.
Keywords :
elemental semiconductors; germanium; island structure; nanostructured materials; self-assembly; semiconductor quantum dots; silicon; Ge; Si; Si(100); electronic properties; higher substrate temperatures; morphological evolution; nanoscale Ge islands; nanostructured electronic materials; narrower island size; optical properties; planar wetting layer; pure Ge growth; self-assembled epitaxial quantum dots; self-assembling quantum dots; spatially indirect; strain-relief mechanisms; three-dimensional islands; type II recombination mechanism; Charge carrier processes; Electron optics; Mechanical factors; Nanostructured materials; Optical materials; Quantum dots; Radiative recombination; Self-assembly; Substrates; Temperature distribution;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2002.800962