High resolution electron microscopy and nano-probe study of CoSm/Cr films

Author

Liu, Y. ; Sellmyer, D.J. ; Robertson, B.W. ; Shan, Z.S. ; Liou, S.H.

Author_Institution

Center for Mater. Res. & Anal., Nebraska Univ., Lincoln, NE, USA

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

2740

Lastpage

2742

Abstract

The crystal structure of the crystallites in CoSm thin films deposited on Cr underlayer was studied by nanodiffraction and high resolution electron microscopy (HREM). It was found that the crystallites have a closed-packed structure. Some nanodiffraction patterns taken from different crystallites using a two nanometer probe can be indexed by two layer stacking AB (HCP structure), three layer stacking ABC (FCC structure), and four layer stacking ABAC (double hexagonal structure), suggesting that a particular local stacking mode could exist. [112¯0] HREM images confirmed that stacking sequence changes within one crystallite. In local regions, random stacking, and unit cells of two layer stacking ABAC were found

Keywords

X-ray chemical analysis; chromium; cobalt alloys; coercive force; crystal structure; ferromagnetic materials; magnetic recording; magnetic thin films; samarium alloys; transmission electron microscopy; CoSm-Cr; FCC structure; HCP structure; closed-packed structure; coercivity; crystal structure; double hexagonal structure; electron microscopy; four layer stacking ABAC; local stacking mode; longitudinal recording media; magnetic thin films; nanodiffraction; nanoprobe study; three layer stacking ABC; two layer stacking AB; Argon; Chromium; Crystallization; Electron microscopy; Grain size; Magnetic films; Magnetic recording; Sputtering; Stacking; Transmission electron microscopy;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.490109

Filename

490109