Title :
Extremely small-chirp electroabsorption-modulator integrated distributed feedback laser diode with a shallow quantum-well absorption layer
Author :
Miyazaki, Yasunori ; Tada, Hitoshi ; Aoyagi, Toshitaka ; Nishimura, Takashi ; Mitsui, Yasuo
Author_Institution :
High Frequency & Opt. Semicond. Div., Mitsubishi Electr. Corp., Hyogo, Japan
fDate :
8/1/2002 12:00:00 AM
Abstract :
We have developed an extremely small-chirp electroabsorption modulator integrated with a distributed feedback laser diode (EAM-DFB-LD) with a novel shallow quantum-well (QW) absorption layer. By using a shallow QW absorption layer, the estimated lifetime of the photogenerated holes and thus the estimated concentration of the holes generated by optical absorption has been reduced to 9% of that for a conventional QW. It was experimentally confirmed that the excess chirp due to the pileup of carriers has been reduced to 10% of that for a conventional QW, and this result is consistent with the estimates. The shallow QW EAM-DFB-LD has shown a chirp parameter |α| less than 0.7 over the entire range of the EAM reverse bias voltage of 0-3 V. Finally, successful 10-Gb/s return to zero transmission has been confirmed through both positive dispersion (+425 ps/nm) and negative dispersion (-425 ps/nm).
Keywords :
carrier lifetime; chirp modulation; distributed feedback lasers; electro-optical modulation; electroabsorption; hole density; integrated optics; optical transmitters; quantum well lasers; 0 to 3 V; 10 Gbit/s; EAM reverse bias voltage; EAM-DFB-LD; InGaAsP; InGaAsP-based MQW structures; carrier pileup; chirp parameter; extremely small-chirp electroabsorption-modulator integrated distributed feedback laser diode; hole concentration; negative dispersion; photogenerated hole lifetime; positive dispersion; return to zero transmission; shallow quantum-well absorption layer; Absorption; Chirp; Diode lasers; Distributed feedback devices; Life estimation; Lifetime estimation; Optical feedback; Optical modulation; Quantum well lasers; Ultraviolet sources;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2002.801030