Title :
High density recording characteristics of sputtered barium ferrite thin films
Author :
Li, Jinshan ; Rosenblum, Stephen S. ; Nojima, Wendy ; Hayashi, Hidetaka ; Sinclair, Robert
Author_Institution :
Dept. of Mater. Sci. & Eng., Stanford Univ., CA, USA
fDate :
11/1/1995 12:00:00 AM
Abstract :
We report the recording characteristics of in-situ crystallized sputtered barium ferrite (BaFe12O19, BaM) thin film media grown on a SiN coated carbon substrate. Using an inductive head with a gap of 0.27 μm at a flying height of 0.1 μm, a linear density, D50, of more than 100 kfci was obtained. The pulse width, PW50, was measured to be 0.35 μm. In contrast to Co alloy media, BaM media do not exhibit superlinear noise behavior, indicating non-exchange coupled grains. A model of decoupled grain assembly was used to calculate signal to noise ratio (SNR), giving calculated values in very good agreement with the experimentally measured values. In addition, the magnetic property optimization of sputtered BaM media was also investigated
Keywords :
barium compounds; coercive force; ferrites; magnetic recording; magnetic thin films; sputtered coatings; 0.1 micron; 0.27 micron; BaFe12O19; coercive force; decoupled grain assembly; flying height; high density recording characteristics; inductive head; linear density; magnetic property optimization; nonexchange coupled grains; pulse width; signal to noise ratio; sputtered thin films; Barium; Crystallization; Ferrites; Magnetic heads; Pulse measurements; Signal to noise ratio; Silicon compounds; Space vector pulse width modulation; Sputtering; Substrates;
Journal_Title :
Magnetics, IEEE Transactions on
