Title :
Automating Postsilicon Debugging and Repair
Author :
Chang, Kai-Hui ; Markov, Igor L. ; Bertacco, Valeria
Author_Institution :
Univ. of Michigan, Ann Arbor, MI
fDate :
7/1/2008 12:00:00 AM
Abstract :
Due to increasing semiconductor design complexity, more errors are escaping presilicon verification and being discovered only after manufacturing. As an alternative to traditional manual chip repair, the authors propose the FogClear methodology, which automates the postsilicon debugging process and thereby reduces IC development time and costs.
Keywords :
Computer bugs; Costs; Debugging; Delay; Design automation; Fabrication; Manufacturing; Process design; Silicon; Time to market; FogClear methodology; electronic design automation; integrated circuits; postsilicon debugging; validation;
DOI :
10.1109/MC.2008.212
