• DocumentCode
    792021
  • Title

    Comparison of Mercuric Iodide and Lead Iodide X-Ray Detectors for X-Ray Imaging Applications

  • Author

    Zentai, G. ; Partain, L. ; Pavlyuchkova, R. ; Proano, C. ; Schieber, M. ; Shah, K. ; Bennett, P. ; Melekhov, L. ; Gilboa, H.

  • Author_Institution
    Ginzton Technol. Center, Mountain View, CA
  • Volume
    53
  • Issue
    5
  • fYear
    2006
  • Firstpage
    2506
  • Lastpage
    2512
  • Abstract
    Mercuric iodide (HgI2) and lead iodide (PbI2) materials have been investigated for several years as direct converter layers for digital x-ray imaging applications. A difficult challenge of both lead iodide and mercuric iodide is the higher than desired leakage currents. These currents are influenced by different factors such as applied electrical field, layer thickness, layer density, electrode structure, material purity and by the deposition parameters. Minimizing the leakage current must also be achieved without adversely affecting charge transport, which plays a large role in gain and is influenced by these parameters. Other challenges relate to increasing film thickness without degrading electrical properties. This paper compares some imagers as the result of optimization process. We deposited the above materials on flat panel thin film transistor (TFT) arrays with 127 um pixel pitch. The imagers were evaluated for both radiographic and fluoroscopic imaging. Modulation Transfer Function (MTF) was measured as a function of the spatial frequency. The MTF data were compared to values published in the literature for indirect detector (CsI). Image lag characteristics of mercuric iodide appear adequate for fluoroscopic rates. The structure and x-ray diffraction data of the two materials were compared to explain the difference in image lag between them
  • Keywords
    X-ray detection; X-ray diffraction; diagnostic radiography; electrical conductivity; leakage currents; optical transfer function; semiconductor counters; CsI; HgI2; PbI2; X-ray detectors; X-ray diffraction data; X-ray image sensors; applied electrical field; charge transport; deposition parameters; digital X-ray imaging applications; direct converter layers; electrical properties; electrode structure; film thickness; flat panel thin film transistor arrays; fluoroscopic imaging; layer density; layer thickness; lead iodide; leakage currents; material purity; medical imaging; mercuric iodide; modulation transfer function; optimization process; pixel pitch; polycrystalline semiconductors; radiographic imaging; spatial frequency; thin film devices; Degradation; Electrodes; Lead; Leakage current; Optical imaging; Radiography; Thin film transistors; Transfer functions; X-ray detectors; X-ray imaging; Lead compounds; medical imaging; mercury compounds; polycrystalline semiconductors; thin film devices; x-ray image sensors; x-ray imaging;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2006.880975
  • Filename
    1710230