Title :
System identification of electronic nose data from cyanobacteria experiments
Author :
Searle, Graham E. ; Gardner, Julian W. ; Chappell, Michael J. ; Godfrey, Keith R. ; Chapman, Michael J.
Author_Institution :
Sch. of Eng., Warwick Univ., Coventry, UK
fDate :
6/1/2002 12:00:00 AM
Abstract :
Linear black-box modeling techniques are applied to both steady state and dynamic data gathered from two electronic nose experiments involving cyanobacteria cultures. Analysis of the data from a strain identification experiment shows that very simple low order MISO black box model structures are able to produce very high success rates (up to 100%) when identifying the toxic strain of cyanobacteria. This is comparable with the best success rates for steady state data reported elsewhere using artificial neural networks. Analysis of data from a growth phase identification experiment using MIMO black-box models produces success rates of 82.3% for steady state data and 76.6% for dynamic data. This compares poorly with the best performing nonlinear artificial neural networks, which obtained a 95.1% success rate on the same data. This demonstrates the limitations of these linear techniques when applied to more difficult problems.
Keywords :
MIMO systems; array signal processing; autoregressive moving average processes; biosensors; gas sensors; identification; intelligent sensors; learning (artificial intelligence); microorganisms; neural nets; pattern classification; sensor fusion; transient response; MIMO models; artificial neural networks; bacterial food spoilage; cyanobacteria cultures; dynamic data; electronic nose; finite impulse response models; growth phase identification; linear black-box modeling; low order MISO model structures; odour classification; pattern recognition algorithms; steady state data; strain identification; system identification; Artificial neural networks; Biomedical monitoring; Capacitive sensors; Data analysis; Electronic noses; Food industry; Medical diagnosis; Microorganisms; Steady-state; System identification;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2002.800286