Micromagnetic and experimental studies of CoPtCr polycrystalline thin film media with bicrystal microstructure

Author

Peng, Qingzhi ; Bertram, H.N. ; Fussing, Nina ; Doerner, M. ; Mirzamaanl, M. ; Margulies, David ; Sinclair, Robert ; Lambert, Steven

Author_Institution

Center for Magnetic Recording Res., California Univ., San Diego, La Jolla, CA, USA

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

2821

Lastpage

2823

Abstract

Polycrystalline CoPtCr/CrV (or Cr) thin films with different Cr concentrations were prepared by sputter deposition on NiP-plated Al substrates. TEM images revealed the existence of bicrystal clusters. High field torque measurement was used to determine the intrinsic anisotropy constant. The M-H loop and torque hysteresis measurement coupled with micromagnetic modeling permitted determination of intergranular interactions. The cross-track correlation length was evaluated from micromagnetic noise calculation and compared well with the result from measured noise spectra. The physical implication of a bicrystal structure is discussed in general

Keywords

bicrystals; chromium alloys; cobalt alloys; ferromagnetic materials; magnetic anisotropy; magnetic hysteresis; magnetic recording noise; magnetic thin films; platinum alloys; sputtered coatings; transmission electron microscopy; CoPtCr polycrystalline thin film; CoPtCr-Cr; CoPtCr-CrV; NiP-plated Al substrates; TEM images; anisotropy constant; bicrystal clusters; cross-track correlation length; hysteresis; intergranular interactions; micromagnetic modeling; microstructure; noise spectra; sputter deposition; torque; Anisotropic magnetoresistance; Chromium; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Micromagnetics; Perpendicular magnetic anisotropy; Sputtering; Torque measurement; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.490163

Filename

490163