Title :
Grain size effect on noise properties in CoCrTa thin film media
Author :
Kojima, S. ; Fukaya, S. ; Yahisa, Y. ; Hosoe, Y. ; Kodama, N.
Author_Institution :
Data Storage & Retrieval Syst. Div., Hitachi Ltd., Kanagawa, Japan
fDate :
11/1/1995 12:00:00 AM
Abstract :
Grain growth of Cr and CoCrTa thin film was examined using high resolution transmission electron microscopy (HRTEM) and high resolution scanning microscopy (HRSEM). The effect of crystallography on media noise was studied. The grain size of the CoCrTa thin film increases with thickness and retains a bi-crystal structure over a range of Cr grain size. Media noise at a high recording density seems to increase with the grain size of Cr underlayer surface. This suggests that the micromagnetization process can be influenced by a bi-crystal structure of Co alloy films at their initial layers
Keywords :
bicrystals; chromium alloys; cobalt alloys; ferromagnetic materials; grain growth; grain size; magnetic recording noise; magnetic thin films; scanning electron microscopy; tantalum alloys; transmission electron microscopy; CoCrTa thin film; CoCrTa-Cr; Cr underlayer; bicrystal structure; crystallography; grain growth; grain size; high resolution scanning electron microscopy; high resolution transmission electron microscopy; micromagnetization; noise; recording density; Chromium alloys; Cobalt alloys; Grain boundaries; Grain size; Lattices; Magnetic films; Magnetic noise; Surface morphology; Transistors; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
