Title :
Reactively evaporated Co thin film for tape media
Author :
Pan, Tao ; Spratt, Geoffrey W.D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
11/1/1995 12:00:00 AM
Abstract :
The dependence of the magnetic properties of reactively evaporated Co on film thickness and oxygen pressure have been studied. The coercivity was found to be very sensitive to oxygen pressure, but the coercive squareness and coercivity peak at different values of oxygen pressure for the same thickness. An optimized 500 Å Co-O film deposited at an oxygen pressure of 1.6 μtorr, exhibits a coercivity of 2000 Oe, a coercive squareness S* of 0.7, an Mrt of 2.2 memu/cm2, a remanence squareness of 0.9 and an anisotropy constant of 3.5×106 erg/cc. Auger spectroscopy reveals an oxygen content of 30 at.% throughout the film thickness
Keywords :
Auger effect; cobalt; coercive force; ferromagnetic materials; magnetic anisotropy; magnetic tapes; magnetic thin films; remanence; vacuum deposited coatings; 1.6E-6 torr; Auger spectroscopy; Co:O; anisotropy constant; coercive squareness; coercivity; magnetic properties; oxygen pressure; reactively evaporated Co thin film; remanence squareness; tape media; Coercive force; Magnetic anisotropy; Magnetic films; Magnetic properties; Magnetic recording; Optical films; Perpendicular magnetic anisotropy; Saturation magnetization; Substrates; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
