DocumentCode
792504
Title
Low-loss high power RF switching using multifinger AlGaN/GaN MOSHFETs
Author
Koudymov, A. ; Xuhong Hu ; Simin, K. ; Simin, G. ; Ali, Mohamed ; Yang, J. ; Asif Khan, M.
Author_Institution
Dept. of Electr. Eng., South Carolina Univ., Columbia, SC, USA
Volume
23
Issue
8
fYear
2002
Firstpage
449
Lastpage
451
Abstract
We demonstrate a novel RF switch based on a multifinger AlGaN/GaN MOSHFET. Record high saturation current and breakdown voltage, extremely low gate leakage current and low gate capacitance of the III-N MOSHFETs make them excellent active elements for RF switching. Using a single element test circuit with 1-mm wide multifinger MOSHFET we achieved 0.27 dB insertion loss and more than 40 dB isolation. These parameters can be further improved by impedance matching and by using submicron gate devices. The maximum switching power extrapolated from the results for 1A/mm 100 μm wide device exceeds 40 W for a 1-mm wide 2-A/mm MOSHFET.
Keywords
III-V semiconductors; aluminium compounds; field effect transistor switches; gallium compounds; junction gate field effect transistors; microwave field effect transistors; microwave switches; power MOSFET; power semiconductor switches; wide band gap semiconductors; 0.27 dB; 40 W; AlGaN-GaN; RF switch; active elements; heterostructure field-effect transistor; high breakdown voltage; high saturation current; impedance matching; insertion loss; low gate capacitance; low gate leakage current; low-loss high power; metal-oxide-semiconductor HFET; multifinger MOSHFET; submicron gate devices; Aluminum gallium nitride; Capacitance; Circuit testing; Gallium nitride; Impedance matching; Insertion loss; Leakage current; MOSHFETs; Radio frequency; Switches;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2002.801301
Filename
1021089
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