• DocumentCode
    792504
  • Title

    Low-loss high power RF switching using multifinger AlGaN/GaN MOSHFETs

  • Author

    Koudymov, A. ; Xuhong Hu ; Simin, K. ; Simin, G. ; Ali, Mohamed ; Yang, J. ; Asif Khan, M.

  • Author_Institution
    Dept. of Electr. Eng., South Carolina Univ., Columbia, SC, USA
  • Volume
    23
  • Issue
    8
  • fYear
    2002
  • Firstpage
    449
  • Lastpage
    451
  • Abstract
    We demonstrate a novel RF switch based on a multifinger AlGaN/GaN MOSHFET. Record high saturation current and breakdown voltage, extremely low gate leakage current and low gate capacitance of the III-N MOSHFETs make them excellent active elements for RF switching. Using a single element test circuit with 1-mm wide multifinger MOSHFET we achieved 0.27 dB insertion loss and more than 40 dB isolation. These parameters can be further improved by impedance matching and by using submicron gate devices. The maximum switching power extrapolated from the results for 1A/mm 100 μm wide device exceeds 40 W for a 1-mm wide 2-A/mm MOSHFET.
  • Keywords
    III-V semiconductors; aluminium compounds; field effect transistor switches; gallium compounds; junction gate field effect transistors; microwave field effect transistors; microwave switches; power MOSFET; power semiconductor switches; wide band gap semiconductors; 0.27 dB; 40 W; AlGaN-GaN; RF switch; active elements; heterostructure field-effect transistor; high breakdown voltage; high saturation current; impedance matching; insertion loss; low gate capacitance; low gate leakage current; low-loss high power; metal-oxide-semiconductor HFET; multifinger MOSHFET; submicron gate devices; Aluminum gallium nitride; Capacitance; Circuit testing; Gallium nitride; Impedance matching; Insertion loss; Leakage current; MOSHFETs; Radio frequency; Switches;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2002.801301
  • Filename
    1021089