Title :
An 8-Channel DRAGO Readout Circuit for Silicon Detectors With Integrated Front-End JFET
Author :
Fiorini, C. ; Porro, M. ; Frizzi, T.
Author_Institution :
Politecnico di Milano
Abstract :
We have developed a CMOS circuit to be used with Silicon Drift Detectors (SDDs) for X-ray spectroscopy and gamma-ray imaging applications. The circuit operates with the input transistor integrated directly on the detector wafer. The circuit is composed of 8 analog channels, each including a low-noise voltage preamplifier, a 6th order semi-Gaussian shaping amplifier, with four selectable peaking times from 1.8 mus up to 6 mus, and a peak stretcher. The integrated time constant used for the shaping are implemented by means of a recently proposed ´RC´ cell. This cell is based on the de- magnification of the current flowing in a resistor R thanks to the use of current mirrors. The 8 analog channels of the chip are multiplexed to a single analog output. A digital section provides self-resetting of the channels, trigger output and the external programming of independent threshold on the analog channels by means of a 3 bit DAC and a programmable serial register. In this work, the main features of the circuit are described. The measurement results obtained in the characterization of the prototype are then reported and discussed. The energy resolution measured using a single channel of the chip with a Silicon Drift Detector Droplet (SDD3) is of 128 eV at 6 keV with the detector cooled at -20degC. Spectroscopy measurements using a multi-element SDD are also shown
Keywords :
CMOS integrated circuits; JFET integrated circuits; X-ray detection; X-ray spectroscopy; gamma-ray detection; junction gate field effect transistors; nuclear electronics; preamplifiers; readout electronics; semiconductor device noise; silicon radiation detectors; 3 bit DAC; 8-channel DRAGO readout circuit; CMOS circuit; Drift detector Array Gamma camera for Oncology; RC cell; X-ray spectroscopy; analog channels; current flow; current mirrors; demagnification; detector cooling; detector wafer; energy resolution; gamma-ray imaging applications; input transistor; integrated front-end JFET; integrated time constant; low-noise voltage preamplifier; multiplexed chip; peak stretcher; programmable serial register; prototype characterization; resistor; semiGaussian shaping amplifier; silicon drift detectors; trigger output; Gamma ray detection; Gamma ray detectors; JFET integrated circuits; Nuclear imaging; Semiconductor device measurement; Silicon; Spectroscopy; X-ray detection; X-ray detectors; X-ray imaging; Low-noise readout circuit; silicon detectors; silicon drift detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2006.882605