Title :
Optimal excess noise reduction in thin heterojunction Al0.6Ga0.4As-GaAs avalanche photodiodes
Author :
Kwon, Oh-Hyun ; Hayat, Majeed M. ; Wang, Shuling ; Campbell, Joe C. ; Holmes, Archie, Jr. ; Pan, Yi ; Saleh, Bahaa E A ; Teich, Malvin C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM, USA
Abstract :
It has been recently found that the initial-energy effect, which is associated with the finite initial energy of carriers entering the multiplication region of an avalanche photodiode (APD), can be tailored to reduce the excess noise well beyond the previously known limits for thin APDs. However, the control of the initial energy of injected carriers can be difficult in practice for an APD with a single multiplication layer. In this paper, the dead-space multiplication recurrence theory is used to show that the low noise characteristics associated with the initial-energy effect can be achieved by utilizing a two-layer multiplication region. As an example, a high bandgap Al0.6Ga0.4As material, termed the energy-buildup layer, is used to elevate the energy of injected carriers without incurring significant multiplication events, while a second GaAs layer with a lower bandgap energy is used as the primary carrier multiplication layer. Computations show that devices can be optimally designed through judicious choice of the charge-layer width to produce excess noise factor levels that are comparable to those corresponding to homojunction APDs benefiting from a maximal initial-energy effect. A structure is presented to achieve precisely that.
Keywords :
III-V semiconductors; aluminium compounds; avalanche photodiodes; gallium arsenide; optical noise; Al0.6Ga0.4As-GaAs; avalanche photodiode; bandgap energy; dead-space multiplication recurrence theory; energy-buildup layer; excess noise; excess noise factor levels; finite initial energy; high bandgap material; initial-energy effect; injected carriers; low noise characteristics; maximal initial-energy effect; multiplication region; optimal excess noise reduction; primary carrier multiplication layer; single multiplication layer; thin heterojunction Al0.6Ga0.4As-GaAs avalanche photodiodes; two-layer multiplication region; Avalanche photodiodes; Gain measurement; Gallium arsenide; Heterojunctions; Impact ionization; Measurement uncertainty; Noise level; Noise reduction; Photonic band gap; Predictive models;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2003.817671