A soft error rate track density model for MR heads

Author

Wiesen, Kurt ; Lansky, Richard M. ; Perkins, Tim

Author_Institution

Appl. Magnetics Corp., Goleta, CA, USA

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

3066

Lastpage

3068

Abstract

The calculation of soft error rate from models of the disk, head, and channel is used to predict optimum read and write widths for MR heads. For a 4.3 μm track pitch, 120 kfci, and PR4 coding, the best write width is 3.8 μm and the best read width is 2.9 μm. The optimum write width is relatively insensitive to track misregistration and read and write width process variations. The optimum read width decreases with increasing track misregistration. The soft error rate is most sensitive to write-to-write track misregistration

Keywords

error statistics; magnetic heads; magnetic recording noise; magnetoresistive devices; transmission line theory; MR heads; PASER; PR4 coding; nonlinear 1D transmission line model; optimum read width; optimum write width; soft error rate track density model; track misregistration; track pitch; width process variations; write-to-write track misregistration; Analog-digital conversion; Calibration; Equalizers; Error analysis; Magnetic heads; Predictive models; Probability density function; Transducers; Transmission lines; White noise;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.490271

Filename

490271