Title :
A 150-MS/s 8-b 71-mW CMOS time-interleaved ADC
Author :
Limotyrakis, Sotirios ; Kulchycki, Scott D. ; Su, David K. ; Wooley, Bruce A.
Author_Institution :
Center for Integrated Syst., Stanford, CA, USA
fDate :
5/1/2005 12:00:00 AM
Abstract :
A pipelined analog-to-digital converter (ADC) architecture suitable for high-speed (150 MHz), Nyquist-rate A/D conversion is presented. At the input of the converter, two parallel track-and-hold circuits are used to separately drive the sub-ADC of a 2.8-b first pipeline stage and the input to two time-interleaved residue generation paths. Beyond the first pipeline stage, each residue path includes a cascade of two 1.5-b pipeline stages followed by a 4-b "backend" folding ADC. The full-scale residue range at the output of the pipeline stages is half that of the converter input range in order to conserve power in the operational amplifiers used in each residue path. An experimental prototype of the proposed ADC has been integrated in a 0.18-μm CMOS technology and operates from a 1.8-V supply. At a sampling rate of 150 MSample/s, it achieves a peak SNDR of 45.4 dB for an input frequency of 80 MHz. The power dissipation is 71 mW.
Keywords :
CMOS analogue integrated circuits; analogue-digital conversion; comparators (circuits); mixed analogue-digital integrated circuits; operational amplifiers; sample and hold circuits; switched capacitor networks; 0.18 micron; 1.8 V; 150 MHz; 71 mW; 80 MHz; CMOS analog integrated circuits; CMOS technology; CMOS time-interleaved ADC; analog-digital conversion; backend folding ADC; comparators; converter input range; folding AD converters; full-scale residue range; high-speed Nyquist-rate AD conversion; mixed analog-digital integrated circuits; operational amplifiers; parallel track-and-hold circuits; pipeline processing; pipeline stage; pipelined analog-to-digital converter architecture; power conservation; switched-capacitor circuits; time-interleaved residue generation path; Analog-digital conversion; CMOS technology; Circuits; Frequency; Operational amplifiers; Pipelines; Power amplifiers; Power dissipation; Prototypes; Sampling methods; Analog–digital (A/D) conversion; CMOS analog integrated circuits; comparators; folding A/D converters; mixed analog–digital integrated circuits; operational amplifiers; pipeline processing; switched-capacitor circuits;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2005.845992