• DocumentCode
    793641
  • Title

    Thermal-mechanical enhanced high-performance silicone gels and elastomeric encapsulants in microelectronic packaging

  • Author

    Wong, C.P.

  • Author_Institution
    AT&T Bell Labs., Princeton, NJ, USA
  • Volume
    18
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    270
  • Lastpage
    273
  • Abstract
    A modern electronic device is a complex 3-D structure that consists of millions of components for each single integrated circuit (IC) chip. This complex and delicate device requires effective encapsulation and packaging to ensure its long-term reliability. This device encapsulant requires not only excellent electrical and physical properties, but also suitable mechanical properties for hostile and extreme temperature cycling requirements (from -65° to 150°C). Hence, the mechanical and thermal behavior of the encapsulant plays a critical role in device reliability. Low stress encapsulants are the preferred choice for microelectronic packaging. Silicone-based materials, either the elastomers or gels, with their low modulus and excellent electrical properties, are the best encapsulants. However, the intrinsic low modulus silicone provides weak mechanic protection for the IC device. We have, however, modified the silicone material with a high loading of silica to improve its mechanical and physical properties. This high-silica filler loading material improves not only its mechanical property, but also its modulus. Furthermore, this modified high modulus silicone material tends to have microcracks during the high temperature thermal cycling testing that generates the device reliability problem. In this paper, we will describe a modified version of the thermal-mechanical enhanced silicone-based encapsulant, its material formulation, curing process, thermal mechanical failure and its protecting mechanisms, and its application
  • Keywords
    encapsulation; filled polymers; gels; integrated circuit packaging; integrated circuit reliability; mechanical properties; polymer films; silicones; thermal stability; thermal stress cracking; thermal stresses; -65 to 150 C; curing process; elastomeric encapsulants; encapsulation; high modulus silicone material; integrated circuit chip; long-term reliability; mechanical properties; microelectronic packaging; protecting mechanisms; silica loaded material; silicone gels; siloxane polymer; thermal-mechanical failure; Electronic packaging thermal management; Encapsulation; Integrated circuit packaging; Integrated circuit reliability; Mechanical factors; Microelectronics; Protection; Silicon compounds; Temperature; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.390302
  • Filename
    390302