• DocumentCode
    793688
  • Title

    A low-power wide dynamic range envelope detector

  • Author

    Zhak, Serhii M. ; Baker, Michael W. ; Sarpeshkar, Rahul

  • Author_Institution
    Res. Lab. of Electron., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • Volume
    38
  • Issue
    10
  • fYear
    2003
  • Firstpage
    1750
  • Lastpage
    1753
  • Abstract
    We report a 75-dB 2.8-μW 100-Hz-10-kHz envelope detector in a 1.5-μm 2.8-V CMOS technology. The envelope detector performs input dc insensitive voltage-to-current converting rectification followed by novel nanopower current-mode peak detection. The use of a subthreshold wide linear range transconductor allows greater than 1.7-Vpp input voltage swings. We show theoretically that the optimal performance of this circuit is technology independent for the given topology and may be improved only by spending more power due to thermal noise rectification limits. A novel circuit topology is used to perform 140-nW peak detection with controllable attack and release time constants. We demonstrate good agreement of experimentally measured results with theory. The envelope detector is useful in low-power bionic implants for the deaf, hearing aids, and speech-recognition front-ends.
  • Keywords
    CMOS analogue integrated circuits; biomedical electronics; convertors; hearing aids; high-pass filters; low-power electronics; network topology; peak detectors; prosthetics; solid-state rectifiers; 1.5 micron; 100 Hz to 10 kHz; 140 nW; 2.8 V; 2.8 muW; CMOS technology; bionic ear; circuit topology; cochlear implant; controllable attack time constants; controllable release time constants; hearing aids; input dc insensitive voltage-to-current converting rectification; low-power bionic implants; low-power wide dynamic range envelope detector; nanopower current-mode peak detection; optimal performance; peak detection; speech-recognition front-ends; subthreshold wide linear range transconductor; thermal noise rectification limits; Auditory implants; CMOS technology; Circuit noise; Circuit topology; Deafness; Dynamic range; Envelope detectors; Hearing aids; Transconductors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2003.817599
  • Filename
    1233793