DocumentCode :
793688
Title :
A low-power wide dynamic range envelope detector
Author :
Zhak, Serhii M. ; Baker, Michael W. ; Sarpeshkar, Rahul
Author_Institution :
Res. Lab. of Electron., Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume :
38
Issue :
10
fYear :
2003
Firstpage :
1750
Lastpage :
1753
Abstract :
We report a 75-dB 2.8-μW 100-Hz-10-kHz envelope detector in a 1.5-μm 2.8-V CMOS technology. The envelope detector performs input dc insensitive voltage-to-current converting rectification followed by novel nanopower current-mode peak detection. The use of a subthreshold wide linear range transconductor allows greater than 1.7-Vpp input voltage swings. We show theoretically that the optimal performance of this circuit is technology independent for the given topology and may be improved only by spending more power due to thermal noise rectification limits. A novel circuit topology is used to perform 140-nW peak detection with controllable attack and release time constants. We demonstrate good agreement of experimentally measured results with theory. The envelope detector is useful in low-power bionic implants for the deaf, hearing aids, and speech-recognition front-ends.
Keywords :
CMOS analogue integrated circuits; biomedical electronics; convertors; hearing aids; high-pass filters; low-power electronics; network topology; peak detectors; prosthetics; solid-state rectifiers; 1.5 micron; 100 Hz to 10 kHz; 140 nW; 2.8 V; 2.8 muW; CMOS technology; bionic ear; circuit topology; cochlear implant; controllable attack time constants; controllable release time constants; hearing aids; input dc insensitive voltage-to-current converting rectification; low-power bionic implants; low-power wide dynamic range envelope detector; nanopower current-mode peak detection; optimal performance; peak detection; speech-recognition front-ends; subthreshold wide linear range transconductor; thermal noise rectification limits; Auditory implants; CMOS technology; Circuit noise; Circuit topology; Deafness; Dynamic range; Envelope detectors; Hearing aids; Transconductors; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2003.817599
Filename :
1233793
Link To Document :
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