Title :
Slow-wave electrode for use in compound semiconductor electrooptic modulators
Author :
Jaeger, Nicolas A F ; Lee, Zachary K F
Author_Institution :
Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
fDate :
8/1/1992 12:00:00 AM
Abstract :
A slow-wave electrode structure for integrated optic traveling-wave modulators in which the microwave´s effective refractive index is matched to the optical wave´s effective refractive index is described. The electrode structure is a capacitively loaded coplanar strip waveguide which can be formed in a single layer of metallization. Fabrication can be accomplished by a single photo-resist patterning, followed by an etching and a standard lift-off technique. Based on the use of gallium arsenide substrates and modern lithographic techniques allowing fabrication with micron scale resolution, slow-wave electrodes having a microwave effective refractive index of 3.5, as well as 50 and 75 Ω characteristic impedances are proposed. The theory of slow-wave electrodes is developed, and slow-wave electrodes have been designed, fabricated, and tested to verify the theory. Measurement results are found to agree well with the theory
Keywords :
electro-optical devices; electrodes; etching; integrated optics; optical modulation; optical workshop techniques; photolithography; refractive index; resists; semiconductor growth; 50 ohm; 75 ohm; GaAs substrates; capacitively loaded coplanar strip waveguide; characteristic impedances; compound semiconductor electrooptic modulators; effective refractive index; etching; integrated optic traveling-wave modulators; lithographic techniques; metallization; micron scale resolution; microwave effective refractive index; single layer; single photo-resist patterning; slow-wave electrode structure; standard lift-off technique; Coplanar waveguides; Electrodes; Integrated optics; Loaded waveguides; Optical modulation; Optical refraction; Optical variables control; Optical waveguides; Refractive index; Strips;
Journal_Title :
Quantum Electronics, IEEE Journal of