Title :
Competition between Base and Substrate Junctions for Free Carriers in Microcircuit Collector Regions
Author_Institution :
The Boeing Company Aerospace Group Seattle, Washington
Keywords :
Current density; Current measurement; Electric resistance; Ionization; Leakage current; Photoconductivity; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1969.4325512
