BIST scheme for DAC testing

Author

Chang, S.J. ; Lee, C.-L. ; Chen, J.E.

Author_Institution

Dept. of Electron. Eng., Nat. Chiao-Tung Univ., Hsin-Chu, Taiwan

Volume

38

Issue

15

fYear

2002

fDate

7/18/2002 12:00:00 AM

Firstpage

776

Lastpage

777

Abstract

A low-cost, built-in self-test (BIST) scheme for a digital-to-analogue converter (DAC) is presented. The basic idea is to convert the DAC output voltages corresponding to different input codes into different oscillation frequencies through a voltage controlled oscillator (VCO), and further transfer these frequencies to different digital codes using a counter. According to the input and output codes, performances of a DAC, such as offset error, gain error, differential nonlinearity (DNL), integral nonlinearity (INL), could be effectively detected by simply using digital circuits rather than complex analogue ones. In addition, the annoying DAC output noise could be naturally filtered out by this BIST method

Keywords

automatic test pattern generation; built-in self test; digital-analogue conversion; integrated circuit testing; mixed analogue-digital integrated circuits; voltage-controlled oscillators; BIST scheme; DAC testing; different digital codes; differential nonlinearity; digital signal processor; gain error; index counter; integral nonlinearity; low-cost; mixed-signal IC; multiplexer; noise effect reduction; offset error; pattern counter; test pattern generator; voltage controlled oscillator;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el:20020530

Filename

1021835