Title :
Annealing effects of Co/Ni multilayers
Author :
Zhang, Y.B. ; Woollam, J.A.
Author_Institution :
Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA
fDate :
11/1/1995 12:00:00 AM
Abstract :
Several series of sputtered Co(0.2 nm)/Ni (0.8 nm) multilayered films have been annealed up to 425°C in air. The annealed samples maintain a perpendicular easy direction and have large magnetic coercivity values. For one annealing condition, the perpendicular magneto-optic hysteresis loop showed 100% remanence with a coercivity of 1.5 KOe and a magneto-optical figure of merit of 0.25 degrees. The magnetic coercivity, Kerr rotation, and Kerr ellipticity as a function of annealing temperature and annealing time are presented in this paper
Keywords :
Kerr magneto-optical effect; annealing; cobalt; coercive force; magnetic hysteresis; magnetic multilayers; nickel; perpendicular magnetic anisotropy; remanence; sputtered coatings; 425 C; Co-Ni; Co/Ni multilayers; Kerr ellipticity; Kerr rotation; annealing; magnetic coercivity; magneto-optic hysteresis loop; magneto-optical figure of merit; perpendicular easy axis; remanence; sputtered films; Annealing; Coercive force; Gold; Magnetic multilayers; Magnetic properties; Magnetooptic effects; Magnetooptic recording; Nonhomogeneous media; Perpendicular magnetic recording; Temperature;
Journal_Title :
Magnetics, IEEE Transactions on
