DocumentCode :
794323
Title :
Measurements of Stress Waves in Solids by Dynamc Photoelasticity
Author :
Honnold, V.R. ; Berggren, C.C. ; Peffley, W.M.
Author_Institution :
Hughes Aircraft Company Fullerton, California
Volume :
16
Issue :
6
fYear :
1969
Firstpage :
255
Lastpage :
259
Abstract :
The technique of dynamic stress-birefringence has been applied in two unique ways to a study of stress waves in solids. Observations of both longitudinal and shear waves, induced in Plexiglas by a pulsed beam of high-energy electrons, have been made with a polariscope operating in the visible. Stress waves induced in silicon by an exploding wire facility were studied with the polariscope in the infrared. The theories of thermoelasticity and birefringence are reviewed briefly and solutions describing stress induced by transient energy depositions are obtained. These solutions are compared to experimental results obtained with a flash x-ray generator.
Keywords :
Birefringence; Electron beams; Photoelasticity; Polarization; Silicon; Solids; Stress measurement; Thermal stresses; Thermoelasticity; Wire;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1969.4325535
Filename :
4325535
Link To Document :
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