A short wavelength R-&thetas; scanning laser microscope and optical disc tester for the characterization of optical recording media

Author

Heyes, N.A.E. ; Wright, C.D. ; Clegg, W.W. ; Zhao, J.

Author_Institution

Sch. of Eng., Manchester Univ., UK

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

3271

Lastpage

3273

Abstract

The design and applications of a novel, short wavelength, combined R-θ scanning laser microscope (SLM) and optical disc tester that is used for the imaging of recorded bit structures and the characterization of optical recording media is described. The instrument is optimised for magneto-optical recording applications and provides images with sub-micron resolution. Imaging is achieved by focusing the light from an argon-ion laser (514 nm or 488 nm wavelength) to a diffraction limited spot on the surface of a rotating sample to generate the line scan, whilst moving the objective lens slowly in the radial direction to generate the frame scan

Keywords

image resolution; magneto-optical recording; optical microscopes; optical microscopy; optical testing; 488 nm; 514 nm; Ar-ion laser focusing; diffraction limited spot; frame scan; line scan; magneto-optical recording; optical disc tester; optical recording media characterization; recorded bit structures; rotating sample surface; short wavelength R-&thetas; scanning laser microscope; submicron resolution images; Focusing; Image resolution; Instruments; Magnetooptic recording; Optical design; Optical imaging; Optical microscopy; Optical recording; Structural discs; Testing;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.490346

Filename

490346