DocumentCode
794351
Title
USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)
Volume
16
Issue
6
fYear
1969
Firstpage
271
Lastpage
282
Keywords
Chemical industry; Electronic equipment testing; Ionizing radiation; Laboratories; Nuclear Instruments - n42; Radiation detectors; Semiconductor device testing; Semiconductor radiation detectors; Silicon; USA Councils;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1969.4325538
Filename
4325538
Link To Document