• DocumentCode
    794366
  • Title

    AlGaInN resonant-cavity LED devices studied by electromodulated reflectance and carrier lifetime techniques

  • Author

    Blume, G. ; Hosea, T.J.C. ; Sweeney, S.J. ; de Mierry, P. ; Lancefield, D.

  • Author_Institution
    Adv. Technol. Inst., Univ. of Surrey, Guildford, UK
  • Volume
    152
  • Issue
    2
  • fYear
    2005
  • fDate
    4/8/2005 12:00:00 AM
  • Firstpage
    118
  • Lastpage
    124
  • Abstract
    AlGaInN-based resonant-cavity light-emitting diodes (RCLEDs) emitting in the blue at 480 nm are investigated. The electromodulated reflectivity spectra of these devices exhibit a blue shift of the quantum well (QW) feature when it is perturbed with increasing reverse bias pulses. This is due to a reduction of the quantum-confined Stark-effect and this is used to calculate the average piezo-electric field in the QW as 0.62 ± 0.12 MV/cm. Measurements of the light-current characteristics of processed devices between 20°C and 85°C and of the modulation bandwidth are also used to characterise the samples and to compare their performance with conventional LEDs. Compared to AlGaInP-based RCLEDs, it is found that the AlGaInN-based RCLEDs are less temperature sensitive, while their modulation characteristics are similar, and better than conventional InGaN-based LEDs. The radiative lifetime was estimated to be 2 ns at a current density of 170 A/cm2.
  • Keywords
    III-V semiconductors; aluminium compounds; electro-optical modulation; electroreflectance; gallium compounds; indium compounds; light emitting diodes; optical resonators; quantum well devices; radiative lifetimes; spectral line shift; 2 ns; 480 nm; 85 degC; AlGaInN; AlGaInN resonant-cavity LED devices; blue shift; carrier lifetime techniques; current density; electromodulated reflectance; electromodulated reflectivity spectra; modulation characteristics; piezo-electric field; quantum well feature; quantum-confined Stark-effect; radiative lifetime;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:20045020
  • Filename
    1425782