Title :
Self-purging redundancy with adjustable threshold for tolerating multiple module failures
Author :
Chiou, C.W. ; Yang, T.C.
Author_Institution :
Chung Shan Inst. of Sci. & Technol., Lung-Tan, Taiwan
fDate :
5/25/1995 12:00:00 AM
Abstract :
A new self-purging digital system is presented which can automatically adjust threshold as failed modules are purged. The switch used is slightly more complex than for alternative systems but multiple module failures can be tolerated at any given time
Keywords :
fault tolerant computing; logic circuits; redundancy; adjustable threshold; failed module purging; failure toleration; multiple module failures; self-purging digital system; self-purging redundancy;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19950627