Title :
The effect of Pd layer thickness on the magnetic and magneto-optical properties of Pd/(Pt/Co/Pt) modulated multilayers
Author :
Xiao, Ying ; Xu, Jun-Hao ; Wittborn, Jesper ; Makino, Y. ; Rao, K.V. ; Lee, Zuo Yi
Author_Institution :
Dept. of Condensed Matter Phys., R. Inst. of Technol., Stockholm, Sweden
fDate :
11/1/1995 12:00:00 AM
Abstract :
A series of Pd-tPd/(Pt-2 Å/Co-3 Å/Pt-2 Å) modulated multilayer films with Pd layer thickness tPd ranging from 3 to 12 Å have been deposited on oxidized Si substrates. SQUID magnetic and Kerr hysteresis measurements reveal that large magnetic moment and Kerr rotation is achieved in the multilayers with Pd layer thicknesses less than 6 Å. This result, and X-ray diffraction data, suggest that the Pd layer thickness strongly affects the magnitude of the induced magnetic moment and Kerr rotation as well as the sharpness of the interfaces of Pd/(Pt/Co/Pt) multilayers. A Kerr rotation of 0.3° is observed near 400 nm in the multilayer film with tPd of 6 Å. The multilayers with tPd of 6 to 12 Å exhibit perpendicular magnetic anisotropy energies
Keywords :
Kerr magneto-optical effect; X-ray diffraction; cobalt; magnetic hysteresis; magnetic moments; magnetic multilayers; palladium; perpendicular magnetic anisotropy; platinum; 400 nm; Kerr rotation; Pd layer; Pd-Pt-Co-Pt; Pt/Co/Pt modulated multilayer films; SQUID magnetic hysteresis; X-ray diffraction; interface sharpness; magnetic moment; magnetic properties; magneto-optical properties; oxidized Si substrates; perpendicular magnetic anisotropy; Magnetic anisotropy; Magnetic films; Magnetic hysteresis; Magnetic moments; Magnetic multilayers; Perpendicular magnetic anisotropy; Rotation measurement; SQUIDs; Semiconductor films; Substrates;
Journal_Title :
Magnetics, IEEE Transactions on
