Title :
Long-Term Stability Characteristics of Commonly Used Channel Electron Multipliers
Author :
Klettke, B.D. ; Krym, N.D. ; Wolber, W.G.
Author_Institution :
Bendix Research Laboratories Southfield, Michigan
Abstract :
The gains of seven units of a commonly used channel electron multiplier model have been observed as a function of total accumulated counts in a clean, ion-pumped vacuum station at 3 ?? 10-10 Torr. After decreasing by a factor of two to three during the first 5 ?? 107 counts of operation, all gains remained relatively constant until the channel multipliers had each accumulated about 1010 counts at which time a continual degradation began. A typical channel electron multiplier degraded from a gain of 1.25 ?? 108 at 1010 counts to 7.0 ?? 107 at 1.4 ?? 1011 total accumulated counts, The effects of gain fatigue on high count-rate capability, on resistance, and on the output pulse-height spectrum shape are also presented, Less extensive data showing the long-term stability characteristics of a newer model of channel multiplier with longer life are included.
Keywords :
Degradation; Electron emission; Electron multipliers; Electron tubes; Fatigue; Laboratories; Space vector pulse width modulation; Stability; Surface treatment; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1970.4325563