DocumentCode
79463
Title
Double-Layer Metallic Holes Lens Based on Continuous Modulation of Phase and Amplitude
Author
Yinghu He ; Zhongquan Wen ; Li Chen ; Yuyan Li ; Yingzhi Ning ; Gang Chen
Author_Institution
Key Lab. of Optoelectron. Technol. & Syst., Chongqing Univ., Chongqing, China
Volume
26
Issue
18
fYear
2014
fDate
Sept.15, 15 2014
Firstpage
1801
Lastpage
1804
Abstract
We have demonstrated numerically a lens design based on continuous modulation of both phase and amplitude utilizing array of double-layer metallic aluminum holes filled with silicon dioxide. The tuning range is 0-π and 0-0.3 for phase and amplitude, respectively, at wavelength 365 nm, allowing flexible lens design. Two lenses are designed and compared. At wavelength 365 nm, the lens based on pure phase modulation generates a 600-nm hot spot at a distance of 6.5 μm, while the phase-amplitude-modulation-based lens leads to an improved focusing spot size of 450 nm, which is beyond the diffraction limit 608 nm and the superoscillation criterion 462 nm. An example of subwavelength superoscillation focusing (0.32λ) is also demonstrated with a continuous amplitude modulated lens, which shows small sidelobe and broad view field. Our approach shows great potential in superoscillation lens design and can be applied to other optical spectrum ranges as well.
Keywords
aluminium; amplitude modulation; lenses; light diffraction; numerical analysis; optical design techniques; optical focusing; optical modulation; optical tuning; phase modulation; silicon compounds; Al-Al-SiO2; continuous phase modulation; diffraction limit; double-layer metallic aluminum hole array; double-layer metallic hole lens; focusing spot size; phase-amplitude-modulation-based lens; silicon dioxide; subwavelength superoscillation focusing; superoscillation criterion; superoscillation lens design; wavelength 365 nm; Amplitude modulation; Diffraction; Focusing; Lenses; Optical waveguides; Phase modulation; Refractive index; Optical devices; focusing; lenses; nanostructures; optical modulation;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2014.2333525
Filename
6848759
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