• DocumentCode
    794663
  • Title

    Analysis of magnetic induction distribution by scanning Lorentz/interference electron microscopy

  • Author

    Takahashi, Yoshio ; Yajima, Yusuke ; Ichikawa, Masakazu ; Kuroda, Katsuhiro

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    31
  • Issue
    6
  • fYear
    1995
  • fDate
    11/1/1995 12:00:00 AM
  • Firstpage
    3367
  • Lastpage
    3369
  • Abstract
    A new observation technique of magnetic induction base on the combination of differential phase contrast and interface electron microscopy has been developed. This technique can be used to clearly to visualize the magnetic induction distribution in and around the specimen. Furthermore, the quantitative determination of induction strength with a unit of h/e (h: Planck´s constant, e: electron charge) can also be made possible
  • Keywords
    electromagnetic induction; electron microscopy; magnetic variables measurement; scanning electron microscopy; differential phase contrast; magnetic induction distribution; scanning Lorentz electron microscopy; scanning interference electron microscopy; Detectors; Electron beams; Interference; Magnetic analysis; Magnetic flux; Magnetic force microscopy; Magnetic separation; Probes; Scanning electron microscopy; Transmission electron microscopy;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.490384
  • Filename
    490384
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=794663