DocumentCode
794674
Title
AlGaN-GaN HEMTs on SiC with CW power performance of >4 W/mm and 23% PAE at 35 GHz
Author
Lee, C. ; Saunier, P. ; Jinwei Yang ; Khan, Muhammad Asad
Author_Institution
Res. & Dev. Eng., TriQuint Semicond. Texas, Richardson, TX, USA
Volume
24
Issue
10
fYear
2003
Firstpage
616
Lastpage
618
Abstract
Continuous wave Ka-band power performance of AlGaN-GaN high electron-mobility transistors grown on semi-insulating SiC substrates are reported. The devices, with gate lengths of 0.25 μm, exhibited maximum drain current density of 1.1 A/mm and peak extrinsic transconductance of 285 mS/mm. At 35 GHz, an output power density of 4.13 W/mm with 23% of power-added efficiency (PAE) and 7.54 dB of linear gain were achieved at a drain bias of 30 V. These power results represent the best power density, PAE, and gain combination reported at this frequency. The drain bias dependence of the Ka-band power performance of these devices is also presented.
Keywords
III-V semiconductors; aluminium compounds; current density; gallium compounds; millimetre wave field effect transistors; millimetre wave power transistors; power HEMT; silicon compounds; substrates; wide band gap semiconductors; 0.25 micron; 23 percent; 285 mS/mm; 30 V; 35 GHz; 7.54 dB; AlGaN-GaN; AlGaN-GaN HEMT; EHF; Ka-band power performance; MM-wave power transistors; PAE; SiC; drain current density; high electron-mobility transistors; linear gain; peak extrinsic transconductance; power density; power-added efficiency; semi-insulating SiC substrates; Aluminum gallium nitride; Gain; Gallium nitride; HEMTs; MODFETs; Microwave devices; Power amplifiers; Power generation; Silicon carbide; Thermal conductivity;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2003.817383
Filename
1233932
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